Photon-induced Deactivations of Multiple Traps in CH₃NH₃PbI₃ Perovskite Films by Different Photon Energies

Asmida Herawati^1*, Hui-Ching Lin¹, Shun-Hsiang Chan², Ming-Chung Wu^2,3, Tsong Shin Lim¹, Forest Shih-Sen Chien¹

¹Department of Applied Physics, Tunghai University, Taichung, Taiwan
²Department of Chemical and Materials Engineering, Chang Gung University, Taiyuan, Taiwan
³Division of Neonatology, Department of Pediatrics, Chang Gung Memorial Hospital, Taoyuan, Taiwan

* Presenter:Asmida Herawati, email:asmida.herawati@mail.ugm.ac.id

Photon-induced trap deactivation is commonly observed in organometal halide perovskites. Trap deactivation is characterized by an obvious photoluminescence (PL) enhancement. In this work, the properties of traps in CH₃NH₃PbI₃ perovskite films were studied by the PL enhancement excited with lasers of different wavelengths, say 633 nm and 405 nm. Two kinds of electron traps were observed; one can be deactivated by both 633 nm and 405 nm illuminations, while the other one can only be deactivated by 405 nm illumination. The energy levels of those two traps were studied.

Keywords: Organometal halide perovskite, Trapping defect, Trap deactivation, Photochemical reaction